DRIFT IN TEM: CAUSES AND SOLUTIONS

DRIFT IN TEM: CAUSES AND SOLUTIONS   Drift in TEM refers to a continuous, slow, unidirectional or cyclical movement of the sample region within the field of view during observation or imaging. It severely degrades the quality of high-resolution imaging and spectroscopic analysis (e.g., EDS). Below are the main causes of drift and their corresponding…

INTELLIGENT SIDE-MOUNTED TEM CAMERA INTEGRATION – EMSIS RETRACTABLE TECHNOLOGY

A smart approach to side-entry TEM imaging Side-mounted cameras are widely used in transmission electron microscopy (TEM) when a large field of view is required for specimen searching, navigation, overview imaging or diffraction. However, integrating a camera into the side-entry port presents a fundamental engineering challenge: the detector must be positioned accurately at the microscope’s…

CHOOSE THE RIGHT CAMERA FOR YOU APPLICATION

Which Camera is Best suitable for my Application   At EMSIS , our cameras are primarily used for Transmission Electron Microscopy (TEM) imaging in life sciences, materials science, semiconductor, diffraction, and dynamic/in-situ studies. EMSIS currently offers both bottom-mounted and side-entry cameras, with RADIUS software providing acquisition, image processing, and TEM control. Below we listed some…