DRIFT IN TEM: CAUSES AND SOLUTIONS

DRIFT IN TEM: CAUSES AND SOLUTIONS   Drift in TEM refers to a continuous, slow, unidirectional or cyclical movement of the sample region within the field of view during observation or imaging. It severely degrades the quality of high-resolution imaging and spectroscopic analysis (e.g., EDS). Below are the main causes of drift and their corresponding…

CELEBRATING 10 YEARS OF EMSIS IN MUNSTER GERMANY

In the last few days, we had the pleasure of joining my colleagues in the beautiful and historical city of Münster, Germany, to celebrate the 10th anniversary of EMSIS. It was a meaningful reunion, filled with learning, laughter, and unforgettable moments. We received hands-on training on EMSIS’s latest camera and software innovations, enjoyed delicious German…

EMSIS Asia in Asia Pacific Microscopy Conference

Asia Pacific Microscopy Conference is officially underway, and EMSIS Asia is thrilled to be part of this event! Over the last few days, we have been connecting with brilliant minds, sharing insights, and showcasing how our cutting-edge solutions are pushing the boundaries of microscopy. A lot of customers, friends and parters come visited us at…