FROM ELECTRON TO PHOTON TO PIXEL – SCINTILLATOR-BASED CMOS DETECTION IN TEM
Converting an electron image into a digital image In Transmission Electron Microscopy (TEM), the sample is illuminated by a high-energy electron beam. As the electrons pass through sample, they are scattered, diffracted (according to the structure and composition of the sample) and the resulting electron distribution will be converted into a visible image can…