Graphitised carbon black provides a stable resolution standard for TEM resolution testing. The graphitised carbon black particles exhibit lattice planes following the contours of the particles. Lattice plane distance is 0.34nm. Supplied on a holey carbon film on a copper TEM grid
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SEM pin stub Ø38 diameter top, standard pin, aluminium
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Zeiss pin stub Ø100 diameter top, short pin, aluminium
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EM-Tec HJ50 Hitachi M4 adapter for Ø50mm JEOL stubs, M4
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Micro-Tec MTCD-5 Multiple target calibration standard with 4 patterns
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EM-Tec TV25 variable 0-90° angle tilt holder for stubs up Ø38mm, pin
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Hitachi Ø32x10mm M4 cylinder SEM sample stub, aluminium
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EM-Tec multi stub preparation stand for 6 JEOL or Hitachi Ø32mm stubs
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FEI F50 long brass SEM stage adapter pillar only, 50mmxM6F
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EM-Tec S-Clip sample holder with 1xS-Clip 45° on Ø25.4mm pin stub
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EM-Tec single sided conductive copper SEM tape 10mm x 30m
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EM-Tec FSB100D FIB lift-out grid storage box with pair of band clips
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EM-Tec 7.TI high precision tweezers, style 7, very fine curved tips, titanium
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Micro-Tec CT2 carbon fibre reinforced PVDF probe, curved pointed / strong flat
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Value-Tec PV3 sliding collet pin vise, 0.1 to 1.2mm
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EM-Tec S-Clip sample holder with various number S-Clip on Ø100mm pin stub
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Aluminium Target, various disk sizes, 99.999% Al
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EMR Lacey Carbon support film on nickel, various hexagonal mesh
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EM-Tec TR2 TEM resolution standard graphitised carbon black
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Double 45/90 degree angled Zeiss pin stub Ø25.4 diameter, short pin, aluminium
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EM-Tec J25H JEOL Ø25mm adapter for Hitachi M4 stubs, Ø25x10mm
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EM-Tec P45 fixed 45° pre-tilt holder for pin stubs/holders, Ø12.7x17mm, pin
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EM-Tec FS25 with pin stub. Combines the the wider FIB grid holder vise with a holder for samples on the Ø25.4mm pin stubs in a single compact holder. This provides a single loading cycle for FIB grids and samples and short distances from form lift-out to lamellae mounting. Wafer type sample surface is at the same height as the FIB grid posts.
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EM-Tec P70 EBSD 70° pre-tilt holder for pin stubs/holders, Ø12.7x20mm, pin
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JEOL Ø32x5mm cylinder SEM sample stub, aluminium
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EM-Tec V120 versatile vise clamp sample holder for up to 120mm, M4
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EM-Tec H6 multi stub holder for 6 x Ø15mm Hitachi stubs, Ø50x6mm, M4
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EM-Tec AG42 strong and highly conductive silver cement, 25g bottle
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EM-Tec 707.CN ESD safe PA66/carbon fibre reinforced tweezers, sharp tips
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Value-Tec M7 mini needle probes 0.70mm with handle, stainless steel, 63mm
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Value-Tec VP1 probe with straight tip, hexagonal handle, 410 stainless steel
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EM-Tec S-Clip sample holder with various number S-Clip on Ø63x6mm stub, M4
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Palladium Target, various sizes Annular on Support Ring, 99.99% Pd
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EMR Lacey Carbon support film on gold, various square mesh
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EM-Tec FIB lift-out grids, Cu, 4 posts
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