• 12-000276-1

EM-Tec FS25 FIB grid and sample holder for up to 5 FIB grids and Ø25.4mm pin stub, pin

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EM-Tec FS25 with pin stub. Combines the the wider FIB grid holder vise with a holder for samples on the Ø25.4mm pin stubs in a single compact holder. This provides a single loading cycle for FIB grids and samples and short distances from form lift-out to lamellae mounting. Wafer type sample surface is at the same height as the FIB grid posts.

Product Description

EM-Tec FS25 FIB grid and sample holder for up to 5 FIB grids and Ø25.4mm pin stub, pin