Calibration Standards and Samples – EMSIS ASIA – Electron Microscopy Imaging Company

CCS-1 Micro-Tec 1mm cross scale, 0.01mm div., Si/Cr, opaque, different mounts

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CCS-10 Micro-Tec 10mm cross scale, 0.01mm div., Si/Cr, opaque, different mounts

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CCS-2.5 Micro-Tec 1inch cross scale, 0.001inch div., Si/Cr, opaque, different mounts

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CCS-5 Micro-Tec 5mm cross scale, 0.01mm div., Si/Cr, opaque, different mounts

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EM-Tec Au on C resolution standard 1, 5-200nm

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EM-Tec Au on C resolution standard 2, 30-300nm

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EM-Tec Au on C resolution standard 3, 3-50nm

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EM-Tec Au on C resolution standard 4, 2-30nm

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EM-Tec CXS-10BE BSD calibration standard, 10 materials plus F/C on pin stub

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EM-Tec CXS-5BE BSD calibration standard, 5 materials plus F/C on pin stub

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EM-Tec CXS-5C light element and EDS calibration standard, 5 materials plus 200M TEM grid on pin stub

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EM-Tec CXS-5F light element and EDS calibration standard, 5 materials plus F/C on pin stub

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EM-Tec CXS-5LE light element and EDS calibration standard, 5 materials plus F/C on pin stub

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EM-Tec CXS-5N light element and EDS calibration standard, 5 materials plus F/C on pin stub

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EM-Tec CXS-5TX EDAX LEX/TEX calibration standard, 5 materials plus F/C on pin stub

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EM-Tec CXS-5TX EDAX TEX calibration standard, 5 materials plus F/C on pin stub

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EM-Tec CXS-6BE BSD calibration standard, materials plus F/C on pin stub

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EM-Tec CXS-6F light element and EDS calibration standard, 6 materials plus F/C on pin stub

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EM-Tec CXS-6LE light element and EDS calibration standard, 6 materials plus F/C on pin stub

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EM-Tec LAMC-15 Large area magnification calibration standard

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EM-Tec M-1 calibration standard with 1µm grid pattern

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EM-Tec M-10 calibration standard with 10µm grid pattern

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EM-Tec MCS-0.1CF certified calibration standard, 2.5mm to 100nm

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EM-Tec MCS-0.1TR traceable calibration standard, 2.5mm to 100nm

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EM-Tec MCS-1CF certified calibration standard, 2.5mm to 1µm

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EM-Tec MCS-1TR traceable calibration standard, 2.5mm to 1µm

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EM-Tec RXS-10PD peak deconvolution test standard, 10 materials plus F/C on pin stub

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EM-Tec RXS-10RA Raman mineral analysis test standard, 10 materials plus F/C on pin stub

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EM-Tec RXS-18RE rare earth reference standard, 18 materials plus F/C on pin stub

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EM-Tec RXS-21RE rare earth reference standard, 21 materials plus F/C on pin stub

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EM-Tec RXS-2WSi resolution and contrast test standard, fused W/Si plus F/C on pin stub

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EM-Tec RXS-36M metals reference standard, 36 metals plus F/C on pin stub

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EM-Tec RXS-40MC mineral reference standard, 40 minerals plus F/C on pin stub

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EM-Tec RXS-7CL cathode-luminescence test standard, 7 materials on pin stub

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EM-Tec RXS-TaSi resolution and contrast test standard, fused Ta/Si plus F/C on pin stub

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EM-Tec Sn on C resolution standard 6, 5nm-30um

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EM-Tec Sn on C resolution standard 7, 10-100nm

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EM-Tec TC1 TEM calibration standard oriented gold crystal

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EM-Tec TC2 TEM calibration standard evaporated Al film

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EM-Tec TC3 TEM EDX calibration standard Cu foil on Al grid

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EM-Tec TR1 TEM resolution standard fine gold particles

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EM-Tec TR2 TEM resolution standard graphitised carbon black

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EM-Tec TS1 TEM test standard perforated carbon film

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EM-Tec TS2 TEM test standard evaporated Pt/Ir

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EM-Tec TS3 TEM combined test specimen standard

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LCS-10 Micro-Tec 10mm linear compound scale, 1, 0.1, 0.01mm div., Si/Cr, opaque, different mounts

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MAG*I*CAL traceable TEM calibration standard

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Micro-Tec MTC-5 Multiple target calibration standard with 4 patterns

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Micro-Tec MTCD-5 Multiple target calibration standard with 4 patterns

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