Micro-Tec MTCD-5 Multiple target calibration standard with 4 patterns – EMSIS ASIA – Electron Microscopy Imaging Company

Micro-Tec MTCD-5 Multiple target calibration standard with 4 patterns

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SKU: 31-T33700 Categories: Calibration Standards and Samples, SEM FIB Magnification

Description
Additional Information

Product Description

Micro-Tec MTCD-5 Multiple target calibration standard with 4 patterns

Additional Information

Mount Type	Mounted on 25.4mm pin stub, Mounted on 25mm Hitachi stub, Mounted on 25mm JEOL stub, Mounted on black microscope slide, Mounted on custom specimen stub, Unmounted