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EM-Tec 254G.AM SEM pin stub gripper tweezers for Ø25.4mm pin stubs, anti-magnetic stainless steel
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EM-Tec 318G.AM SEM pin stub gripper tweezers for Ø32mm pin stubs, anti-magnetic stainless steel
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EM-Tec 95.AM SEM stub gripper tweezers for Ø9.5mm cylinder stubs, anti-magnetic stainless steel
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EM-Tec 122.AM SEM stub gripper tweezers for Ø12.2mm cylinder stubs, anti-magnetic stainless steel
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EM-Tec 150.AM SEM stub gripper tweezers for Ø15mm cylinder stubs, anti-magnetic stainless steel
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EM-Tec single sided conductive copper SEM tape 3mm x 30m
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Micro-Tec ESD safe mini vacuum pick-up tool with 4 tips and 4 vacuum cups
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Zeiss pin stub Ø32 diameter top, short pin, aluminium
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EM-Tec single sided conductive aluminium SEM tape 10mm x 33m
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Micro-Tec PV5 long probe holder for probe diameters 0.1-0.65mm, stainless steel, 152mm
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SEM pin stub Ø12.7 diameter top, standard pin, aluminium
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FEI F22 SEM stage adapter base, 20mm x M6F, aluminium
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Hitachi Ø15x10mm M4 dish SEM sample stub, aluminium
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Hitachi Ø15x10mm M4 cylinder SEM sample stub, aluminium
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ISI/ABT/Topcon Ø15x10mm SEM cylinder sample stub, aluminium
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Value-Tec set of 6 larger industrial strong tweezers, includes style 110/510/66X/667/682/686, magnetic stainless steel
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EM-Tec 250.AM SEM stub gripper tweezers for Ø25mm cylinder stubs, anti-magnetic stainless steel
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EM-Tec 320.AM SEM stub gripper tweezers for Ø32mm cylinder stubs, anti-magnetic stainless steel
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Value-Tec SiC fine emery stone stick set
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Low profile SEM pin stub Ø12.7 diameter with 38° for FEI FIB, aluminium
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Low profile Zeiss pin stub Ø12.7 diameter with 36° for Zeiss SEM/ FIB systems, short pin, aluminium
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Low profile SEM pin stub Ø12.7 diameter with 35° for Tescan FIBxSEM, aluminium
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EM-Tec C39 strong conductive carbon cement, 25g bottle
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EM-Tec S-Clip sample holder with 1x S-Clip on 19mm pin stub
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EM-Tec S-Clip sample holder with 1x S-Clip on Ø19mm Zeiss pin stub
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EM-Tec S-Clip sample holder with 1x S-Clip on Ø15x10mm stub, M4
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Micro-Tec PS5 probe set with Micro-Tec PV1 probe holder and Micro-Tec C5 carbon steel needle probes (Pkg/10)
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Gilder SB50 TEM grid storage box for 50 TEM grids
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JEOL Ø25×12.7mm cylinder SEM sample stub, aluminium
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SEM pin stub Ø9.5 diameter top, standard pin, aluminium
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Zeiss pin stub Ø9.5 diameter top, short pin, aluminium
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EM-Tec NI41 strong and good conductive nickel cement, 25g bottle
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SEM pin stub Ø63 diameter top, standard pin, aluminium
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Zeiss pin stub Ø63 diameter top, short pin, aluminium
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EM-Tec R4 adapter sleeve for 25mm/1inch metallographic mounts
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JEOL Ø25x16mm angled SEM sample stub with 45 degree, aluminium
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Hitachi Ø25x6mm M4 cylinder SEM sample stub, aluminium
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Gilder SB100 TEM grid storage box for 100 TEM grids
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SEM pin stub Ø25.4 diameter top, standard pin, aluminium
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EM-Tec single sided conductive copper SEM tape 6mm x 30m
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SEM pin stub Ø12.7 diameter top, standard pin, copper
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Micro-Tec T5 straight ultra-fine tungsten needle probe, 0.52mm with 0.6µm tip, 25mm
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Zeiss pin stub Ø25.4 diameter top, short pin, aluminium
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EM-Tec Z4 Zeiss pin stub to Hitachi M4 adapter , straight for smaller stubs/holders
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EM-Tec P4 pin stub adapter for Hitachi M4, straight for smaller stubs/holders
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Hitachi Ø63x6mm M4 cylinder SEM sample stub, aluminium
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Hitachi Ø25×13.5mm/M6 stem pin type SEM sample stub, aluminium
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EM-Tec S-Clip sample holder with various number S-Clip on Ø25.4mm pin stub
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EM-Tec S-Clip sample holder with various number S-Clip on Ø32mm pin stub
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EM-Tec S-Clip sample holder with various number S-Clip on Ø25.4mm Zeiss pin stub
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