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Micro-Tec PS8 probe set with Micro-Tec PV1 probe holder and Micro-Tec T5 straight ultra-fine tungsten needle probe
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Gilder G200TT TEM grid, thick/thin bar 200 square mesh, various materials
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EM-Tec 2W.AM precision wafer handling tweezers for Ø2/51mm, anti-magnetic stainless steel”
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Phenom PHA32 adapter ring to hold 25mm/1 inch diameter mounts in the Phenom metallurgical holder
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EM-Tec multi stub preparation stand for 38 pin stubs
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EM-Tec multi stub preparation stand for 8 JEOL or Hitachi Ø25mm stubs
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EM-Tec multi stub preparation stand for 6 JEOL or Hitachi Ø32mm stubs
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JEOL Ø9.5×9.5mm cylinder SEM sample stub, aluminium
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EM-Tec GR2 needle / tube sample holder for up to Ø2mm, gold plated brass, pin
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EM-Tec PR4 pin stub adapter for Hitachi M4 with support rim for larger stubs/holders
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EM-Tec ZR4 Zeiss pin stub to Hitachi M4 adapter with support rim for larger stubs/holders
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EM-Tec slotted TEM support grids, various slot sizes, various Materials
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EM-Tec 4.AM high precision tweezers, style 4, very sharp fine tips, anti-magnetic stainless steel
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Cambridge S4 type SEM stub Ø32mm, aluminium
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EM-Tec J25H JEOL Ø25mm adapter for Hitachi M4 stubs, Ø25x10mm
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EM-Tec J25P JEOL Ø25mm adapter for pin stubs, Ø25x10mm
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EM-Tec TC2 TEM calibration standard evaporated Al film
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Ø32x5mm spacer discs for EM-Tec reference holder
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EM-Tec slotted mesh TEM support grids, various Mesh, various MaterialsCopper
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JEOL Ø12.2x10mm angled SEM sample stub with 45 and 90 degree, aluminium
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JEOL Ø12.2x5mm cylinder SEM sample stub, aluminium
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EM-Tec 3C.AM high precision tweezers, style 3C, short, very sharp fine tips, anti-magnetic stainless steel
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EM-Tec 3.AM high precision tweezers, style 3, very sharp fine tips, anti-magnetic stainless steel
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EM-Tec 2A.AM high precision tweezers, style 2A, flat accurate round tips, anti-magnetic stainless steel
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EM-Tec 2.AM high precision tweezers, style 2, flat, sharp fine tips, anti-magnetic stainless steel
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EM-Tec 1.AM high precision tweezers, style 1, strong fine tips, anti-magnetic stainless steel
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Gilder HEX TEM grid, standard, various hexagonal Mesh, various Materials
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Gilder PB TEM grid, parallel bar plus central divider, various mesh, various materials
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Gilder P TEM grid, parallel bar, various mesh, various material
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Gilder TEM grid, standard, various square mesh, various materials
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JEOL Ø12.2x10mm angled SEM sample stub with 45 degree, aluminium
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JEOL Ø12.2x10mm cylinder SEM sample stub, aluminium
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EM-Tec 553.AM cryo grid box handling tweezers, 145mm, anti-magnetic stainless steel
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EM-Tec 521.AM Gatan 3View stub handling tweezers, 118mm, anti-magnetic stainless steel
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EM-Tec TEM hexagonal mesh support grids, various Mesh, Various Materials
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EM-Tec TEM square mesh support grids, various Mesh, various Materials
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EM-Tec single sided conductive aluminium SEM tape 20mm x 33m
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JEOL Ø25x16mm cylinder SEM sample stub, aluminium
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JEOL Ø9.5×9.5mm angled SEM sample stub with 45 and 90 degree, aluminium
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EM-Tec HS7 mini M4 cylinder stub dual slot vise clamp, 2x1mm, Ø15x6mm, M4
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EM-Tec PS7 mini pin stub dual slot vise clamp, 2x1mm, Ø15x6mm, pin
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EM-Tec PS11 mini pin stub grid holder for 1 x TEM grid, Ø12.7×3.2mm, pin
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EM-Tec multi stub preparation stand for 23 pin stubs
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JEOL Ø32x5mm cylinder SEM sample stub, aluminium
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Hitachi Ø25x10mm M4 cylinder SEM sample stub, aluminium
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EM-Tec I15H ISI/ABT/Topcon adapter for Hitachi M4 stubs, Ø15x10mm
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EM-tec J12H JEOL Ø12.2mm adapter for Hitachi M4 stubs, Ø12.2x10mm
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JEOL 12P JEOL Ø12.2mm adapter for pin stubs, Ø12.2x10mm
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EM-Tec J10H JEOL Ø9.5mm adapter for Hitachi M4 stubs, Ø9.5×9.5mm
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EM-Tec J10P JEOL Ø9.5mm adapter for pin stubs, Ø9.5×9.5mm
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EM-Tec H10 Hitachi M4 stub extender 10mm fixed, Ø15x10mm, M4
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EM-Tec H15P M4 adapter for pin stub, Ø15x16mm, M4
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Zeiss pin stub Ø19 diameter top, short pin, aluminium
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SEM pin stub Ø19 diameter top, standard pin, aluminium
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EM-Tec single sided conductive copper SEM tape 10mm x 30m
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JEOL Ø9.5×9.5mm angled SEM sample stub with 45 degree, aluminium
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EM-Tec TS1 TEM test standard perforated carbon film
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EM-Tec S-Clip sample holder with various number S-Clip on Ø50x5mm JEOL SEM stub
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EM-Tec S-Clip sample holder with various number S-Clip on Ø50x6mm stub, M4
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EM-Tec S-Clip sample holder with various number S-Clip on Ø50mm Zeiss pin stub
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EM-Tec S-Clip sample holder with various number S-Clip on Ø50mm pin stub
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EM-Tec S-Clip sample holder with 1xS-Clip 45° on Ø25mm JEOL SEM stub
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EM-Tec S-Clip sample holder with 1xS-Clip 45° on Ø25mm stub, M4
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EM-Tec S-Clip sample holder with 1xS-Clip 45° on Ø25.4mm Zeiss pin stub
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EM-Tec S-Clip sample holder with 1xS-Clip 45° on Ø25.4mm pin stub
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EM-Tec JS4 mini cylinder stub vise clamp 0-4mm, JEOL Ø12.2x10mm
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EM-Tec JS3 mini cylinder stub SampleClamp 0-2mm, JEOL Ø12.2x10mm
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EM-Tec JS2 mini cylinder stub tube/needle clamp Ø2mm, JEOL Ø12.2x10mm
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EM-Tec HS2 mini M4 cylinder stub tube/needle clamp Ø2mm , Ø15x10mm, M4
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EM-Tec HS3 mini M4 cylinder stub SampleClamp 0-2mm , Ø15x10mm, M4
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EM-Tec HS6 mini M4 cylinder stub vise clamp 0-6mm, Ø15x10mm, M4
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EM-Tec PS8 pin stub round clamp up to Ø6mm, Ø12.7×7.2mm, pin
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EM-Tec PS5 pin stub round clamp up to Ø3.5mm, Ø12.7×7.2mm, pin
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EM-Tec PS3 mini pin stub SampleClamp 0-2mm, Ø12.7mm, pin
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JEOL Ø9.5x5mm cylinder SEM sample stub, aluminium
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EM-Tec GSPM4 compact standard pin stub adapter with M4 thread, gold plated brass, pin
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EM-Tec GZM4 compact Zeiss pin stub adapter with M4 thread, gold plated brass, short Zeiss pin
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Micro-Tec TA5 angled ultra-fine tungsten needle probe, 0.52mm with 0.6µm tip, 25mm
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EM-Tec S-Clip sample holder with various number S-Clip on Ø38mm Zeiss pin stub
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EM-Tec S-Clip sample holder with various number S-Clip on Ø38mm pin stub
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Zeiss pin stub Ø12.7 diameter top, short pin, aluminium
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Micro-Tec GNS glass fibre reinforced polyamide66 probes, set of all three
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Micro-Tec CTS carbon fibre reinforced PVDF probes, set of all three
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EM-Tec S-Clip sample holder with various number S-Clip on Ø32x10mm JEOL SEM stub
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EM-Tec S-Clip sample holder with various number S-Clip on Ø25x10mm JEOL SEM stub
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EM-Tec S-Clip sample holder with various number S-Clip on Ø32x10mm stub, M4
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EM-Tec S-Clip sample holder with various number S-Clip on Ø25x10mm stub, M4
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EM-Tec S-Clip sample holder with various number S-Clip on Ø32mm Zeiss pin stub
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EM-Tec S-Clip sample holder with various number S-Clip on Ø25.4mm Zeiss pin stub
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EM-Tec S-Clip sample holder with various number S-Clip on Ø32mm pin stub
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EM-Tec S-Clip sample holder with various number S-Clip on Ø25.4mm pin stub
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Hitachi Ø25×13.5mm/M6 stem pin type SEM sample stub, aluminium
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Hitachi Ø63x6mm M4 cylinder SEM sample stub, aluminium
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EM-Tec P4 pin stub adapter for Hitachi M4, straight for smaller stubs/holders
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EM-Tec Z4 Zeiss pin stub to Hitachi M4 adapter , straight for smaller stubs/holders
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Zeiss pin stub Ø25.4 diameter top, short pin, aluminium
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Micro-Tec T5 straight ultra-fine tungsten needle probe, 0.52mm with 0.6µm tip, 25mm
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SEM pin stub Ø12.7 diameter top, standard pin, copper
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EM-Tec single sided conductive copper SEM tape 6mm x 30m
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SEM pin stub Ø25.4 diameter top, standard pin, aluminium
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Gilder SB100 TEM grid storage box for 100 TEM grids
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Hitachi Ø25x6mm M4 cylinder SEM sample stub, aluminium
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JEOL Ø25x16mm angled SEM sample stub with 45 degree, aluminium
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EM-Tec R4 adapter sleeve for 25mm/1inch metallographic mounts
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Zeiss pin stub Ø63 diameter top, short pin, aluminium
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SEM pin stub Ø63 diameter top, standard pin, aluminium
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EM-Tec NI41 strong and good conductive nickel cement, 25g bottle
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Zeiss pin stub Ø9.5 diameter top, short pin, aluminium
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SEM pin stub Ø9.5 diameter top, standard pin, aluminium
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JEOL Ø25×12.7mm cylinder SEM sample stub, aluminium
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Gilder SB50 TEM grid storage box for 50 TEM grids
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Micro-Tec PS5 probe set with Micro-Tec PV1 probe holder and Micro-Tec C5 carbon steel needle probes (Pkg/10)
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EM-Tec S-Clip sample holder with 1x S-Clip on Ø15x10mm stub, M4
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EM-Tec S-Clip sample holder with 1x S-Clip on Ø19mm Zeiss pin stub
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EM-Tec S-Clip sample holder with 1x S-Clip on 19mm pin stub
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EM-Tec C39 strong conductive carbon cement, 25g bottle
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Low profile SEM pin stub Ø12.7 diameter with 35° for Tescan FIBxSEM, aluminium
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Low profile Zeiss pin stub Ø12.7 diameter with 36° for Zeiss SEM/ FIB systems, short pin, aluminium
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Low profile SEM pin stub Ø12.7 diameter with 38° for FEI FIB, aluminium
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Value-Tec SiC fine emery stone stick set
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EM-Tec 320.AM SEM stub gripper tweezers for Ø32mm cylinder stubs, anti-magnetic stainless steel
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EM-Tec 250.AM SEM stub gripper tweezers for Ø25mm cylinder stubs, anti-magnetic stainless steel
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Value-Tec set of 6 larger industrial strong tweezers, includes style 110/510/66X/667/682/686, magnetic stainless steel
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ISI/ABT/Topcon Ø15x10mm SEM cylinder sample stub, aluminium
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Hitachi Ø15x10mm M4 cylinder SEM sample stub, aluminium
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Hitachi Ø15x10mm M4 dish SEM sample stub, aluminium
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FEI F22 SEM stage adapter base, 20mm x M6F, aluminium
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SEM pin stub Ø12.7 diameter top, standard pin, aluminium
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Micro-Tec PV5 long probe holder for probe diameters 0.1-0.65mm, stainless steel, 152mm
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EM-Tec single sided conductive aluminium SEM tape 10mm x 33m
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Zeiss pin stub Ø32 diameter top, short pin, aluminium
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Micro-Tec ESD safe mini vacuum pick-up tool with 4 tips and 4 vacuum cups
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EM-Tec single sided conductive copper SEM tape 3mm x 30m
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EM-Tec 150.AM SEM stub gripper tweezers for Ø15mm cylinder stubs, anti-magnetic stainless steel
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EM-Tec 122.AM SEM stub gripper tweezers for Ø12.2mm cylinder stubs, anti-magnetic stainless steel
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EM-Tec 95.AM SEM stub gripper tweezers for Ø9.5mm cylinder stubs, anti-magnetic stainless steel
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EM-Tec 318G.AM SEM pin stub gripper tweezers for Ø32mm pin stubs, anti-magnetic stainless steel
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EM-Tec 254G.AM SEM pin stub gripper tweezers for Ø25.4mm pin stubs, anti-magnetic stainless steel
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Micro-Tec PS2 probe set with Micro-Tec PV1 probe holder and Micro-Tec NAS set of 8 fine pointed angled stainless steel needle probes
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SEM pin stub Ø32 diameter top, standard pin, aluminium
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EM-Tec cryo pin for ultramicrotomes, Ø2x10mm, aluminium
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Value-Tec set with 5 probes (VP1/VP2/VP3/VP4/VP6) in plastic pouch, 410 stainless steel
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Value-Tec set of 5 general purpose tweezers, includes style 3, 5, 5A, 7 and SS (slim long) non-magnetic stainless steel
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EM-Tec GB-4 cryo grid box for 4 TEM grids
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Hitachi Ø32x10mm M4 cylinder SEM sample stub, aluminium
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Low profile Zeiss pin stub Ø12.7 diameter with 90°, short pin, aluminium
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Low profile SEM pin stub Ø12.7 diameter with 90°, aluminium
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JEOL Ø25x8mm cylinder SEM sample stub, aluminium
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Micro-Tec PS3 probe set with Micro-Tec PV1 probe holder and Micro-Tec BS set of 8 fine pointed straight black enameled steel needle probes
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Micro-Tec PS1 probe set with Micro-Tec PV1 probe holder and Micro-Tec NS set of 8 fine pointed straight stainless steel needle probes
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