Products – Page 2 – EMSIS ASIA – Electron Microscopy Imaging Company

Replacement brass float bar for Hitachi HV40 T-base SEM stage adapter, brass

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Hitachi HV48 new style T-base SEM stage adapter assembly, compatible with SU8000 series, SU8200 series, SU6600, SU-70 and S-4800 FESEMs

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Hitachi HV48-6 new style T-base SEM stage adapter assembly with 6mm extra height

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Hitachi HV48-10 new style T-base SEM stage adapter assembly with 10mm extra height

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EM-Tec HJ50 Hitachi M4 adapter for Ø50mm JEOL stubs, M4

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Hitachi TM30 stage adapter kit assembly, compatible with TM33030plus, TM303, TM3000 and TM1000 table top SEMs

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Hitachi HV20 round SEM stage adapter assembly with M4 screw, compatible with S3500 series, S3000 series and S2000 series SEMs, aluminium/brass

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Hitachi HV34 dovetail stage adapter with M4 screw for Hitachi S-3400N, aluminium

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Hitachi HV35 dovetail stage adapter with M4 screw for Hitachi SU3500, aluminium

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Hitachi HV37 dovetail stage adapter with M4 screw for Hitachi S-3700N, aluminium/brass

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EM-Tec J10P JEOL Ø9.5mm adapter for pin stubs, Ø9.5×9.5mm

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EM-Tec J10H JEOL Ø9.5mm adapter for Hitachi M4 stubs, Ø9.5×9.5mm

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JEOL 12P JEOL Ø12.2mm adapter for pin stubs, Ø12.2x10mm

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EM-tec J12H JEOL Ø12.2mm adapter for Hitachi M4 stubs, Ø12.2x10mm

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EM-Tec J25P JEOL Ø25mm adapter for pin stubs, Ø25x10mm

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EM-Tec J25H JEOL Ø25mm adapter for Hitachi M4 stubs, Ø25x10mm

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EM-Tec JV35 versatile dovetail SEM stage adapter with M4 screw for JEOL SEMs 35, 35C, 35CF, 50, 820,840, 880 and JXA 733 microprobe

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EM-Tec JV40 versatile SEM stage adapter with M4 screw for JEOL Neoscope JCM6000 and JCM5000

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EM-Tec JV50 versatile dovetail SEM stage adapter with M4 screw for JEOL SEMs 6510, 6390, 6380, 6360, 6010, 5700, 5600, 5500, 5410, 5400, 5300, T330, T220, T300, T100 and T20

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EM-Tec JV60 versatile dovetail SEM stage adapter with M4 screw for JEOL SEMs 6610, 6490, 6480, 6460, 5910, 5900, 5800 and JIB 4500 FIB/SEM

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EM-Tec JV70 versatile dovetail SEM stage adapter with M4 screw for JEOL FESEMs 7800F, 7601F, 7600F, 7400F, 7100F, 7000F, 6700F, 6500F and SEM iT300

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EM-Tec I15H ISI/ABT/Topcon adapter for Hitachi M4 stubs, Ø15x10mm

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Pemtron PV64 round SEM stage adapter with flat and M4 threaded top, brass

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EM-Tec US6 universal SEM specimen stub adapter set

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EM-Tec Au on C resolution standard 1, 5-200nm

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EM-Tec Au on C resolution standard 2, 30-300nm

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EM-Tec Au on C resolution standard 3, 3-50nm

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EM-Tec Au on C resolution standard 4, 2-30nm

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EM-Tec Sn on C resolution standard 6, 5nm-30um

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EM-Tec Sn on C resolution standard 7, 10-100nm

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EM-Tec MCS-1CF certified calibration standard, 2.5mm to 1µm

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EM-Tec MCS-0.1CF certified calibration standard, 2.5mm to 100nm

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EM-Tec MCS-1TR traceable calibration standard, 2.5mm to 1µm

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EM-Tec MCS-0.1TR traceable calibration standard, 2.5mm to 100nm

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EM-Tec LAMC-15 Large area magnification calibration standard

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Micro-Tec MTC-5 Multiple target calibration standard with 4 patterns

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Micro-Tec MTCD-5 Multiple target calibration standard with 4 patterns

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EM-Tec M-1 calibration standard with 1µm grid pattern

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EM-Tec M-10 calibration standard with 10µm grid pattern

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EM-Tec CXS-5F light element and EDS calibration standard, 5 materials plus F/C on pin stub

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EM-Tec CXS-5C light element and EDS calibration standard, 5 materials plus 200M TEM grid on pin stub

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EM-Tec CXS-5BE BSD calibration standard, 5 materials plus F/C on pin stub

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EM-Tec CXS-5N light element and EDS calibration standard, 5 materials plus F/C on pin stub

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EM-Tec CXS-10BE BSD calibration standard, 10 materials plus F/C on pin stub

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EM-Tec CXS-5LE light element and EDS calibration standard, 5 materials plus F/C on pin stub

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EM-Tec CXS-5TX EDAX TEX calibration standard, 5 materials plus F/C on pin stub

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EM-Tec CXS-5TX EDAX LEX/TEX calibration standard, 5 materials plus F/C on pin stub

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EM-Tec CXS-6F light element and EDS calibration standard, 6 materials plus F/C on pin stub

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EM-Tec CXS-6LE light element and EDS calibration standard, 6 materials plus F/C on pin stub

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EM-Tec CXS-6BE BSD calibration standard, materials plus F/C on pin stub

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EM-Tec RXS-18RE rare earth reference standard, 18 materials plus F/C on pin stub

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EM-Tec RXS-21RE rare earth reference standard, 21 materials plus F/C on pin stub

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EM-Tec RXS-36M metals reference standard, 36 metals plus F/C on pin stub

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EM-Tec RXS-40MC mineral reference standard, 40 minerals plus F/C on pin stub

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EM-Tec RXS-7CL cathode-luminescence test standard, 7 materials on pin stub

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EM-Tec RXS-10PD peak deconvolution test standard, 10 materials plus F/C on pin stub

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EM-Tec RXS-10RA Raman mineral analysis test standard, 10 materials plus F/C on pin stub

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EM-Tec RXS-2WSi resolution and contrast test standard, fused W/Si plus F/C on pin stub

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EM-Tec RXS-TaSi resolution and contrast test standard, fused Ta/Si plus F/C on pin stub

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Amray AR Loop (std) FiIaments (10/Box)

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ISI 2 Leg C-Loop Filaments (10/Box)

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JEOL C-Loop Filaments (6/Box)

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Hitachi Cartridge (Desktop) (10/Box)

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Hitachi V-Loop (10/Box)

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FEI/Philips V-Loop Filaments (10/Box)

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Tescan/Zeiss V-Loop (10/Box)

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AEI/Cambridge V-Loop Filaments (10/Box)

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Denka M3 LaB6 with 90° cone angle 15μm round tip for Zeiss EVO, LEO, Cambridge, Cam Scan, Philips XL-30

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Denka M3 LaB6 with Hitachi S-Type base, 90° cone angle, 15 μm round tip for S-, SU, H- and X-Series SEM and TEM

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LaB6 with 90° cone angle 15μm round tip for ISI, ABT, Topcon SEM

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LaB6 with 90° cone angle 15μm round tip for ISI TEMs

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Denka M3 LaB6 with 90° cone angle 15μm round tip for FEI, Philips, Amray

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Denka M3 LaB6 with 90° cone angle 15μm round tip for JEOL

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Denka M3 LaB6 with 90° cone angle 15μm tip for Zeiss, Tescan

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EBS TFE (equivalent to Denka 174)

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EBS TFE (equivalent Denka 174-C/FEI)

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EBS TFE equivalent to Hitachi CD-SEM

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EM-Tec P36 fixed 36°pre-tilt holder for Zeiss FIB systems, Ø12.7x17mm, pin

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EM-Tec P38 fixed 36°pre-tilt holder for FEI FIB systems, Ø12.7x17mm, pin

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EM-Tec P45 fixed 45° pre-tilt holder for pin stubs/holders, Ø12.7x17mm, pin

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EM-Tec P45M fixed 45° pre-tilt holder for Hitachi M4 stubs/holders, Ø12.7x17mm, pin

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EM-Tec P70 EBSD 70° pre-tilt holder for pin stubs/holders, Ø12.7x20mm, pin

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EM-Tec P70M EBSD 70° pre-tilt holder for Hitachi M4 stubs/holders, Ø12.7x20mm, pin

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EM-Tec GS10 swivel head sample holder for up 10mm, gold plated brass, pin

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EM-Tec GR2 needle / tube sample holder for up to Ø2mm, gold plated brass, pin

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EM-Tec GS25 spider type bulk sample holder for up to Ø25mm, gold plated brass, pin

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EM-Tec GS45 spider type bulk sample holder for up to Ø45mm, gold plated brass, pin

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EM-Tec V22 compact vise type sample holder for up to 22mm, pin

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EM-Tec CV1 centering vise SEM sample holder for up to 110mm, pin

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EM-Tec PS15 Pin stub swivel mount, Ø15x15mm, pin

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EM-Tec GR20 bulk sample holder for up to Ø20mm, gilded brass, pin

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EM-Tec VS42 universal spring-loaded large vise holder for up to 42mm, pin

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EM-Tec VS26 compact double action spring-loaded vise holder for up to 26mm, pin

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EM-Tec GB16 bulk sample holder for up 16mm, gilded brass, pin

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EM-Tec B26 bulk sample holder for up 26mm, aluminium, pin

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EM-Tec M26 metallographic mount holder for 25mm / 1inch mounts, pin

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EM-Tec M32 metallographic mount holder for 30mm / 1-1/4inch mounts, pin

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EM-Tec R32 bulk sample holder for up to Ø32mm, aluminium, pin

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EM-Tec M40 metallographic mount holder for 40mm / 1-1/2inch mounts, pin

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EM-Tec TV12 mini variable 0-90° angle tilt sample holder 11x12mm, pin

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