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EM-Tec MCS-1CF certified calibration standard, 2.5mm to 1µm
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Platinum/Palladium Target, various disk sizes, Pt/Pd 80/20, 99.99% Pt/Pd
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Platinum Target,various disk sizes, 99.99% Pt
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EM-Tec CXS-10BE BSD calibration standard, 10 materials plus F/C on pin stub
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EM-Tec CXS-5LE light element and EDS calibration standard, 5 materials plus F/C on pin stub
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Gold/Palladium Target, various sizes Annular on Support Ring, Au/Pd 60/40, 99.99% Au/Pd
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Denka M3 LaB6 with 90° cone angle 15μm round tip for Zeiss EVO, LEO, Cambridge, Cam Scan, Philips XL-30
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Denka M3 LaB6 with Hitachi S-Type base, 90° cone angle, 15 μm round tip for S-, SU, H- and X-Series SEM and TEM
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Denka M3 LaB6 with 90° cone angle 15μm round tip for JEOL
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Denka M3 LaB6 with 90° cone angle 15μm tip for Zeiss, Tescan
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Gold Target, various sizes Annular on Support Ring, 99.99%. Au
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Platinum Target, various sizes Annular on Support Ring, 99.99% Pt
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LaB6 with 90° cone angle 15μm round tip for ISI TEMs
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LaB6 with 90° cone angle 15μm round tip for ISI, ABT, Topcon SEM
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EM-Tec ST1 STEM imaging holder for TEM/FIB grids, pin
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EM-Tec ST1 STEM imaging holder for TEM/FIB grids, M4
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Denka M3 LaB6 with 90° cone angle 20μm flat tip for FEI, Philips, Amray
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EM-Tec MCS-0.1CF certified calibration standard, 2.5mm to 100nm
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Denka M3 LaB6 with Hitachi S-Type base, 60° cone angle, 10 μm sharp tip for S-, SU, H- and X-Series SEM and TEM
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Denka M3 LaB6 with 60° cone angle 10μm sharp tip for FEI, Philips, Amray
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Denka M3 LaB6 with 60° cone angle 10μm sharp tip for JEOL
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Denka M3 LaB6 with 60° cone angle 10μm sharp tip for Zeiss EVO, LEO, Cambridge, Cam Scan, Philips XL-30
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Denka M3 LaB6 with 60° cone angle 5μm sharp tip for JEOL
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Denka M3 LaB6 with Hitachi S-Type base, 60° cone angle, 5 μm sharp tip for S-, SU, H- and X-Series SEM and TEM
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Denka M3 LaB6 with 60° cone angle 5μm sharp tip for FEI, Philips, Amray
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Denka M3 LaB6 with 60° cone angle 5μm sharp tip for Zeiss EVO, LEO, Cambridge, Cam Scan, Philips XL-30
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Denka M3 LaB6 with 90° cone angle 15μm round tip for FEI, Philips, Amray
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MAG*I*CAL traceable TEM calibration standard
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Iridium Target, various disk sizes, 99.99% Ir
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EM-Tec RXS-36M metals reference standard, 36 metals plus F/C on pin stub
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EM-Tec RXS-18RE rare earth reference standard, 18 materials plus F/C on pin stub
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EM-Tec RXS-40MC mineral reference standard, 40 minerals plus F/C on pin stub
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EM-Tec RXS-21RE rare earth reference standard, 21 materials plus F/C on pin stub
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EBS TFE (equivalent to Denka 174)
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EBS TFE (equivalent Denka 174-C/FEI)
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EBS TFE equivalent to Hitachi CD-SEM
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DENKA TFE 174
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DENKA TFE 147C
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