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EM-Tec V22 compact vise type sample holder for up to 22mm, pin
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EM-Tec GS45 spider type bulk sample holder for up to Ø45mm, gold plated brass, pin
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EM-Tec GS25 spider type bulk sample holder for up to Ø25mm, gold plated brass, pin
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EM-Tec GR2 needle / tube sample holder for up to Ø2mm, gold plated brass, pin
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EM-Tec GS10 swivel head sample holder for up 10mm, gold plated brass, pin
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EM-Tec P70M EBSD 70° pre-tilt holder for Hitachi M4 stubs/holders, Ø12.7x20mm, pin
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EM-Tec P70 EBSD 70° pre-tilt holder for pin stubs/holders, Ø12.7x20mm, pin
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EM-Tec P45M fixed 45° pre-tilt holder for Hitachi M4 stubs/holders, Ø12.7x17mm, pin
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EM-Tec P45 fixed 45° pre-tilt holder for pin stubs/holders, Ø12.7x17mm, pin
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EM-Tec P38 fixed 36°pre-tilt holder for FEI FIB systems, Ø12.7x17mm, pin
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EM-Tec P36 fixed 36°pre-tilt holder for Zeiss FIB systems, Ø12.7x17mm, pin
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EBS TFE equivalent to Hitachi CD-SEM
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EBS TFE (equivalent Denka 174-C/FEI)
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EBS TFE (equivalent to Denka 174)
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Denka M3 LaB6 with 90° cone angle 15μm tip for Zeiss, Tescan
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Denka M3 LaB6 with 90° cone angle 15μm round tip for JEOL
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Denka M3 LaB6 with 90° cone angle 15μm round tip for FEI, Philips, Amray
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LaB6 with 90° cone angle 15μm round tip for ISI TEMs
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LaB6 with 90° cone angle 15μm round tip for ISI, ABT, Topcon SEM
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Denka M3 LaB6 with Hitachi S-Type base, 90° cone angle, 15 μm round tip for S-, SU, H- and X-Series SEM and TEM
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Denka M3 LaB6 with 90° cone angle 15μm round tip for Zeiss EVO, LEO, Cambridge, Cam Scan, Philips XL-30
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AEI/Cambridge V-Loop Filaments (10/Box)
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Tescan/Zeiss V-Loop (10/Box)
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FEI/Philips V-Loop Filaments (10/Box)
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Hitachi V-Loop (10/Box)
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Hitachi Cartridge (Desktop) (10/Box)
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JEOL C-Loop Filaments (6/Box)
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ISI 2 Leg C-Loop Filaments (10/Box)
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Amray AR Loop (std) FiIaments (10/Box)
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EM-Tec RXS-TaSi resolution and contrast test standard, fused Ta/Si plus F/C on pin stub
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EM-Tec RXS-2WSi resolution and contrast test standard, fused W/Si plus F/C on pin stub
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EM-Tec RXS-10RA Raman mineral analysis test standard, 10 materials plus F/C on pin stub
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EM-Tec RXS-10PD peak deconvolution test standard, 10 materials plus F/C on pin stub
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EM-Tec RXS-7CL cathode-luminescence test standard, 7 materials on pin stub
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EM-Tec RXS-40MC mineral reference standard, 40 minerals plus F/C on pin stub
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EM-Tec RXS-36M metals reference standard, 36 metals plus F/C on pin stub
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EM-Tec RXS-21RE rare earth reference standard, 21 materials plus F/C on pin stub
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EM-Tec RXS-18RE rare earth reference standard, 18 materials plus F/C on pin stub
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EM-Tec CXS-6BE BSD calibration standard, materials plus F/C on pin stub
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EM-Tec CXS-6LE light element and EDS calibration standard, 6 materials plus F/C on pin stub
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EM-Tec CXS-6F light element and EDS calibration standard, 6 materials plus F/C on pin stub
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EM-Tec CXS-5TX EDAX LEX/TEX calibration standard, 5 materials plus F/C on pin stub
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EM-Tec CXS-5TX EDAX TEX calibration standard, 5 materials plus F/C on pin stub
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EM-Tec CXS-5LE light element and EDS calibration standard, 5 materials plus F/C on pin stub
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EM-Tec CXS-10BE BSD calibration standard, 10 materials plus F/C on pin stub
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EM-Tec CXS-5N light element and EDS calibration standard, 5 materials plus F/C on pin stub
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EM-Tec CXS-5BE BSD calibration standard, 5 materials plus F/C on pin stub
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EM-Tec CXS-5C light element and EDS calibration standard, 5 materials plus 200M TEM grid on pin stub
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EM-Tec CXS-5F light element and EDS calibration standard, 5 materials plus F/C on pin stub
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EM-Tec M-10 calibration standard with 10µm grid pattern
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This product has multiple variants. The options may be chosen on the product page
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