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EM-Tec C33 fast drying conductive carbon paint, 15g bottle
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EM-Tec GB-30 TEM grid storage box for 30 TEM grids
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Gatan 3View system SEM pin stubs with standard Ø1.4mm flat, Ø2mm pin x12.5mm H, aluminium
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Gatan 3View system SEM pin stubs with large Ø2.4mm flat, Ø2mm pin x12.5mm H, aluminium
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Hitachi Ø32x6mm M4 cylinder SEM sample stub, aluminium
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Ø25x5mm spacer discs for EM-Tec reference holder adapter sleeve
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Value-Tec DB3 long tip air blower / hand duster
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Value-Tec DB2 fine tip air blower/hand duster with non-return valve
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Value-Tec CS1 carbide tipped scriber, 150mm
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EM-Tec 190G.AM SEM pin stub gripper tweezers for Ø19mm pin stubs, anti-magnetic stainless steel
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EM-Tec 127G.AM SEM pin stub gripper tweezers for Ø12.7mm pin stubs, anti-magnetic stainless steel
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Value-Tec set of 5 medium industrial strong tweezers, includes styles 110/127/610/660/66X, magnetic stainless steel
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Hitachi Ø15x6mm M4 cylinder SEM sample stub, aluminium
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Hitachi H4 knurled aluminium locking nut, 4mmxM6
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JEOL Ø25x10mm cylinder SEM sample stub, aluminium
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EM-Tec single sided conductive aluminium SEM tape 6mm x 33m
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SEM pin stub Ø12.7 diameter + 6mm extra height, standard pin, aluminium
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Value-Tec stainless steel crucible tongs, 258mm
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Value-Tec set with 4 probes (VP1/VP2/VP4/VP5) in plastic pouch, 410 stainless steel
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EM-Tec GB-100 TEM grid storage box for 100 TEM grids
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Value-Tec CB2 stainless steel cleaning basket, 55m
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Value-Tec P25B flat nose pliers with brass lined jaws
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Value-Tec flat nose pliers with brass lined jaws
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Micro-Tec C5 straight fine needle probe 0.40mm, nickel plated carbon tool steel, 28mm
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Engraved Zeiss pin stub Ø32 diameter with 12 numbered fields, short pin, aluminium
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Engraved SEM pin stub Ø32 diameter with 12 numbered fields, aluminium
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Micro-Tec CP3 carbon fibre reinforced PEEK probe, sharp flat / large flat
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Micro-Tec CP2 carbon fibre reinforced PEEK probe, curved pointed / strong
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Micro-Tec CP1 carbon fibre reinforced PEEK probe, fine pointed / strong flat
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45/90 degree angled Zeiss pin stub Ø32mm diameter, short pin, aluminium
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Double 90 degree angled Zeiss pin stub Ø32mm diameter, short pin, aluminium
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45/90 degree angled SEM pin stub Ø32mm diameter, standard pin, aluminium
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Double 90 degree angled SEM pin stub Ø32mm diameter, standard pin, aluminium
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EM-Tec FSB100D FIB lift-out grid storage box with pair of band clips
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JEOL Ø32x12mm angled SEM sample stub with 45 and 90 degree, aluminium
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JEOL Ø32x12mm angled SEM sample stub with double 90 degree, aluminium
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Value-Tec PV3 sliding collet pin vise, 0.1 to 1.2mm
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Value-Tec set of 4 short industrial strong tweezers, includes styles 110/127/126/130X, magnetic stainless steel
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EM-Tec FSB100S FIB lift-out grid storage box with single clip
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EM-Tec PS4 mini pin stub vise clamp 0-4mm, Ø12.7×7.2mm, pin
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Hitachi Ø32x12mm M4 angled SEM sample stub, 45 and 90 degree, aluminium
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Hitachi Ø32x12mm M4 angled SEM sample stub, double 90 degree, aluminium
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Low profile Zeiss pin stub Ø12.7 diameter with 1mm height, short pin, aluminium
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Low profile SEM pin stub Ø12.7 diameter with 1mm height, aluminium
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SEM pin stub Ø12.7 diameter top, with flat, standard pin, aluminium
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Value-Tec M7 mini needle probes 0.70mm with handle, stainless steel, 63mm
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Micro-Tec disposable carbon steel scalpels set with plastic handle contains 2x #10/11/15/20/22, sterile
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Hitachi Ø25x8mm M4 angled SEM sample stub, double 45/90 degree, aluminium
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Double 45/90 degree angled Zeiss pin stub Ø25.4 diameter, short pin, aluminium
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Double 45/90 degree angled SEM pin stub Ø25.4 diameter standard pin, aluminium
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