Products – Page 11 – EMSIS ASIA – Electron Microscopy Imaging Company

JEOL Ø32x10mm cylinder SEM sample stub, aluminium

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JEOL Ø25x16mm angled SEM sample stub with 45 degree, aluminium

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JEOL Ø25×12.7mm cylinder SEM sample stub, aluminium

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JEOL Ø25x10mm cylinder SEM sample stub, aluminium

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JEOL Ø12.2x10mm angled SEM sample stub with 45 and 90 degree, aluminium

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JEOL Ø12.2x10mm angled SEM sample stub with 45 degree, aluminium

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JEOL Dish stub, Ø12.2×10 with 1.5mm dish depth, aluminium

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JEOL Ø12.2x10mm cylinder SEM sample stub, aluminium

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JEOL Ø9.5×9.5mm cylinder SEM sample stub, aluminium

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JEOL Ø9.5×9.5mm angled SEM sample stub with 45 and 90 degree, aluminium

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JEOL Ø9.5×9.5mm angled SEM sample stub with 45 degree, aluminium

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JEOL Ø50x5mm cylinder SEM sample stub, aluminium

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JEOL Ø32x5mm cylinder SEM sample stub, aluminium

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JEOL Ø25x8mm cylinder SEM sample stub, aluminium

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JEOL Ø25x5mm cylinder SEM sample stub, aluminium

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JEOL Ø12.2x5mm cylinder SEM sample stub, aluminium

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JEOL Ø9.5x5mm cylinder SEM sample stub, aluminium

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Hitachi Ø25×13.5mm/M6 stem pin type SEM sample stub, aluminium

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Hitachi Ø25x16mm M4 angled SEM sample stub, 45 and 90 degree, aluminium

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Hitachi Ø25x16mm M4 angled SEM sample stub, double 90 degree, aluminium

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Hitachi Ø25x16mm M4 angled SEM sample stub, 45 degree, aluminium

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Hitachi Ø32x12mm M4 angled SEM sample stub, 45 and 90 degree, aluminium

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Hitachi Ø32x12mm M4 angled SEM sample stub, double 90 degree, aluminium

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Hitachi Ø32x10mm M4 cylinder SEM sample stub, aluminium

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Hitachi Ø25x10mm M4 cylinder SEM sample stub, aluminium

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Hitachi Ø15x11mm M4 angled SEM sample stub, 45 and 90 degree, aluminium

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Hitachi Ø15x10mm M4 angled SEM sample stub, 45 degree, aluminium

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Hitachi Ø15x10mm M4 cylinder SEM sample stub, aluminium

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Hitachi Ø15x10mm M4 dish SEM sample stub, aluminium

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Hitachi Ø100×4.5mm M4 cylinder SEM sample stub, aluminium

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Hitachi Ø63x6mm M4 cylinder SEM sample stub, aluminium

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Hitachi Ø50x6mm M4 cylinder SEM sample stub, aluminium

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Hitachi Ø32x6mm M4 cylinder SEM sample stub, aluminium

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Hitachi Ø25x8mm M4 angled SEM sample stub, double 45/90 degree, aluminium

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Hitachi Ø25x6mm M4 cylinder SEM sample stub, aluminium

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Hitachi Ø15x6mm M4 cylinder SEM sample stub, aluminium

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In-lens SEM mount type 4 for Hitachi SU9000, S-5500, S-5200 and S-5000

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In-lens SEM mount type 3 for Hitachi SU9000, S-5500, S-5200 and S-5000

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In-lens SEM mount type 3 for Hitachi SU9000, S-5500, S-5200 and S-5000

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In-lens SEM mount type 1 for Hitachi SU9000, S-5500, S-5200 and S-5000

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EM-Tec CVC2 single large 120 degrees groove vise jaw, 12x40x6mm

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EM-Tec CVC1 standard triple grooved/smooth vise jaw, 12x40x6mm

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EM-Tec CVE1 extension plates 22.5x40x5mm extends CV1 up to 155mm

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EM-Tec P70M EBSD 70° pre-tilt holder for Hitachi M4 stubs/holders, Ø12.7x20mm, pin

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EM-Tec P70 EBSD 70° pre-tilt holder for pin stubs/holders, Ø12.7x20mm, pin

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EM-Tec P45M fixed 45° pre-tilt holder for Hitachi M4 stubs/holders, Ø12.7x17mm, pin

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EM-Tec P45 fixed 45° pre-tilt holder for pin stubs/holders, Ø12.7x17mm, pin

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EM-Tec P38 fixed 36°pre-tilt holder for FEI FIB systems, Ø12.7x17mm, pin

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EM-Tec P36 fixed 36°pre-tilt holder for Zeiss FIB systems, Ø12.7x17mm, pin

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EM-Tec FS25 FIB grid and sample holder for up to 5 FIB grids and Ø25.4mm pin stub, M4

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