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DENKA TFE 147C
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DENKA TFE 174
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EBS TFE equivalent to Hitachi CD-SEM
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EBS TFE (equivalent Denka 174-C/FEI)
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EBS TFE (equivalent to Denka 174)
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EM-Tec RXS-21RE rare earth reference standard, 21 materials plus F/C on pin stub
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EM-Tec RXS-40MC mineral reference standard, 40 minerals plus F/C on pin stub
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EM-Tec RXS-18RE rare earth reference standard, 18 materials plus F/C on pin stub
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EM-Tec RXS-36M metals reference standard, 36 metals plus F/C on pin stub
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Iridium Target, various disk sizes, 99.99% Ir
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MAG*I*CAL traceable TEM calibration standard
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Denka M3 LaB6 with 90° cone angle 15μm round tip for FEI, Philips, Amray
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Denka M3 LaB6 with 60° cone angle 5μm sharp tip for Zeiss EVO, LEO, Cambridge, Cam Scan, Philips XL-30
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Denka M3 LaB6 with 60° cone angle 5μm sharp tip for FEI, Philips, Amray
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Denka M3 LaB6 with Hitachi S-Type base, 60° cone angle, 5 μm sharp tip for S-, SU, H- and X-Series SEM and TEM
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Denka M3 LaB6 with 60° cone angle 5μm sharp tip for JEOL
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Denka M3 LaB6 with 60° cone angle 10μm sharp tip for Zeiss EVO, LEO, Cambridge, Cam Scan, Philips XL-30
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Denka M3 LaB6 with 60° cone angle 10μm sharp tip for JEOL
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Denka M3 LaB6 with 60° cone angle 10μm sharp tip for FEI, Philips, Amray
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Denka M3 LaB6 with Hitachi S-Type base, 60° cone angle, 10 μm sharp tip for S-, SU, H- and X-Series SEM and TEM
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EM-Tec MCS-0.1CF certified calibration standard, 2.5mm to 100nm
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Denka M3 LaB6 with 90° cone angle 20μm flat tip for FEI, Philips, Amray
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EM-Tec ST1 STEM imaging holder for TEM/FIB grids, M4
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EM-Tec ST1 STEM imaging holder for TEM/FIB grids, pin
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LaB6 with 90° cone angle 15μm round tip for ISI, ABT, Topcon SEM
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LaB6 with 90° cone angle 15μm round tip for ISI TEMs
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Platinum Target, various sizes Annular on Support Ring, 99.99% Pt
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Gold Target, various sizes Annular on Support Ring, 99.99%. Au
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Denka M3 LaB6 with 90° cone angle 15μm tip for Zeiss, Tescan
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Denka M3 LaB6 with 90° cone angle 15μm round tip for JEOL
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Denka M3 LaB6 with Hitachi S-Type base, 90° cone angle, 15 μm round tip for S-, SU, H- and X-Series SEM and TEM
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Denka M3 LaB6 with 90° cone angle 15μm round tip for Zeiss EVO, LEO, Cambridge, Cam Scan, Philips XL-30
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Gold/Palladium Target, various sizes Annular on Support Ring, Au/Pd 60/40, 99.99% Au/Pd
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EM-Tec CXS-5LE light element and EDS calibration standard, 5 materials plus F/C on pin stub
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EM-Tec CXS-10BE BSD calibration standard, 10 materials plus F/C on pin stub
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Platinum Target,various disk sizes, 99.99% Pt
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Platinum/Palladium Target, various disk sizes, Pt/Pd 80/20, 99.99% Pt/Pd
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EM-Tec MCS-1CF certified calibration standard, 2.5mm to 1µm
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Gold Target, various disk sizes, 99.99% Au
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Copper Target, various sizes Annular on Support Ring, 99.99% Cu
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EM-Tec RG4 quad geological thin sections top reference holder for 4 petrographic slides up to 48x28mm, pin
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Palladium Target, various sizes Annular on Support Ring, 99.99% Pd
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EM-Tec RG4 quad geological thin sections top reference holder for 4 petrographic slides up to 48x28mm, M4
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Gold/Palladium Target, various disk sizes, Au/Pd 60/40, 99.99% Au/Pd
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Hitachi Cartridge (Desktop) (10/Box)
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EM-Tec RXS-10RA Raman mineral analysis test standard, 10 materials plus F/C on pin stub
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EM-Tec RXS-10PD peak deconvolution test standard, 10 materials plus F/C on pin stub
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EM-Tec RXS-7CL cathode-luminescence test standard, 7 materials on pin stub
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EM-Tec CXS-6BE BSD calibration standard, materials plus F/C on pin stub
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EM-Tec CXS-6LE light element and EDS calibration standard, 6 materials plus F/C on pin stub
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EM-Tec CXS-6F light element and EDS calibration standard, 6 materials plus F/C on pin stub
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EM-Tec CXS-5TX EDAX LEX/TEX calibration standard, 5 materials plus F/C on pin stub
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EM-Tec CV1 centering vise SEM sample holder for up to 110mm, pin
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Palladium Target, various disk sizes, 99.99% Pd
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EM-Tec CV1 centering vise SEM sample holder for up to 110mm, M4
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Tescan/Zeiss V-Loop (10/Box)
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ISI 2 Leg C-Loop Filaments (10/Box)
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EM-Tec CXS-5BE BSD calibration standard, 5 materials plus F/C on pin stub
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EM-Tec MCS-0.1TR traceable calibration standard, 2.5mm to 100nm
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Hitachi V-Loop (10/Box)
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Silver Target, various sizes Annular on Support Ring, 99.99% Ag
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EM-Tec R4 top reference holder for 4x Ø30mm/1-1/4inch metallographic mounts, pin
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EM-Tec R4 top reference holder for 4x Ø30mm/1-1/4inch metallographic mounts, M4
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Hitachi HV48-10 new style T-base SEM stage adapter assembly with 10mm extra height
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Hitachi HV48-6 new style T-base SEM stage adapter assembly with 6mm extra height
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EM-Tec CXS-5TX EDAX TEX calibration standard, 5 materials plus F/C on pin stub
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Tantalum Target, various disk sizes, 99.95% Ta
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Amray AR Loop (std) FiIaments (10/Box)
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JEOL C-Loop Filaments (6/Box)
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EM-Tec V120 versatile vise clamp sample holder for up to 120mm, pin
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EM-Tec RG2 twin geological thin sections top reference holder for 2 petrographic slides up to 48x28mm, pin
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EM-Tec R6 top reference holder for 6x Ø25mm/1inch metallographic mounts, pin
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EM-Tec RG2 twin geological thin sections top reference holder for 2 petrographic slides up to 48x28mm, M4
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EM-Tec R6 top reference holder for 6x Ø25mm/1inch metallographic mounts, M4
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Hitachi HV48 new style T-base SEM stage adapter assembly, compatible with SU8000 series, SU8200 series, SU6600, SU-70 and S-4800 FESEMs
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EM-Tec V120 versatile vise clamp sample holder for up to 120mm, M4
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Chromium Target, various disk sizes, 99.95% Cr
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EM-Tec Au on C resolution standard 4, 2-30nm
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EM-Tec LAMC-15 Large area magnification calibration standard
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Tungsten Target, various disk sizes, 99.95% W
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EM-Tec RXS-TaSi resolution and contrast test standard, fused Ta/Si plus F/C on pin stub
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EM-Tec RXS-2WSi resolution and contrast test standard, fused W/Si plus F/C on pin stub
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EM-Tec CXS-5N light element and EDS calibration standard, 5 materials plus F/C on pin stub
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EM-Tec CXS-5C light element and EDS calibration standard, 5 materials plus 200M TEM grid on pin stub
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EM-Tec CXS-5F light element and EDS calibration standard, 5 materials plus F/C on pin stub
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FEI/Philips V-Loop Filaments (10/Box)
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EM-Tec V80 versatile vise clamp sample holder for up to 80mm, pin
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EM-Tec single layer graphene TEM support film on 2000 fine aperture mesh copper grids
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EM-Tec V80 versatile vise clamp sample holder for up to 80mm, M4
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EM-Tec P49 multi pin stub holder for 49 pin stubs, Ø117x7mm, pin
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EM-Tec P49 multi pin stub holder for 49 pin stubs, Ø117x7mm, M4
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EM-Tec G4 four geological thin sections holder for 4 petrographic slides up to 47x27mm, pin
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Carbon (Graphite) Target, Ø19 x 1.5mm Disc, 99.99% C
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EM-Tec G4 four geological thin sections holder for 4 petrographic slides up to 47x27mm, M4
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Hitachi HV37 dovetail stage adapter with M4 screw for Hitachi S-3700N, aluminium/brass
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Molydenum Target, Ø57 x 0.25mm Disc, 99.95% Mo
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EM-Tec VS26 compact double action spring-loaded vise holder for up to 26mm, pin
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EM-Tec Sn on C resolution standard 6, 5nm-30um
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EM-Tec VS26 compact double action spring-loaded vise holder for up to 26mm, M4
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EM-Tec dual layer graphene TEM support film on 2000 fine aperture mesh copper grids
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