This TEM test standard provides Platinum/Iridium particles evaporated on a holey carbon film. The holes in the carbon film are useful for focussing and astigmatism corrections. The small crystals of Pt/Ir provide excellent high contrast particles for resolution checks using the point separation test. Provided on a 300 mesh Cu TEM grid.
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SEM pin stub Ø9.5 diameter top, standard pin, aluminium
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Zeiss pin stub Ø19 diameter top, short pin, aluminium
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EM-Tec ZJ50 Zeiss pin stub adapter for Ø50mm JEOL stubs
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EM-Tec HJ32 Hitachi M4 adapter for Ø32mm JEOL stubs, M4
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EM-Tec MCS-1CF certified calibration standard, 2.5mm to 1µm
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Hitachi Cartridge (Desktop) (10/Box)
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EM-Tec B26 bulk sample holder for up 26mm, aluminium, pin
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EM-Tec TV25 variable 0-90° angle tilt holder for stubs up Ø38mm, M4
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Hitachi Ø100×4.5mm M4 cylinder SEM sample stub, aluminium
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JEOL Ø25x16mm angled SEM sample stub with 45 and 90 degree, aluminium
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EM-Tec PS14 mini pin stub grid holder for 4 x TEM grids, Ø12.7×3.2mm, pin
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EM-Tec P3/45 multi pin stub holder 45° for 3 pin stubs, Ø25x14mm, pin
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EM-Tec HS16 M4 cylinder stub round clamp up to Ø16mm, Ø25x10mm, M4
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EM-Tec S-Clip swivel mount sample holder with 1xS-Clip, pin
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EM-Tec SB77 large capacity wooden box for 77 standard 12.7mm pin stubs
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EM-Tec GB-4 cryo grid box for 4 TEM grids
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EM-Tec 1.TI high precision tweezers, style 1, strong fine tips, titanium
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Value-Tec P25B flat nose pliers with brass lined jaws
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Double 90 degree angled SEM pin stub Ø32mm diameter, standard pin, aluminium
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Gilder G200TT TEM grid, thick/thin bar 200 square mesh, various materials
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EMR Carbon support film on copper, various square mesh
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EM-Tec TS2 TEM test standard evaporated Pt/Ir
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Engraved SEM pin stub Ø12.7 diameter with 4 numbered fields, aluminium
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EM-Tec PJ32 pin stub adapter for Ø32mm JEOL and Hitachi stubs
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EM-Tec CXS-5BE BSD calibration standard, 5 materials plus F/C on pin stub
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Denka M3 LaB6 with 90° cone angle 15μm tip for Zeiss, Tescan
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EM-Tec F25 FIB grid holder for up to 5 FIB grids, M4
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EM-Tec F25 is a larger FIB grid holder with a M4 threaded hole which can accommodate up to 4 FIB grids of the same thickness. The 25mm wide vise include a ledge for easy positioning of the FIB grids and two brass thumb screws to operate the vise
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Hitachi Ø25x16mm M4 angled SEM sample stub, 45 and 90 degree, aluminium
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EM-Tec multi stub preparation stand for 28 JEOL 9.5mm stubs
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EM-Tec PS12 pin stub vise clamp 0-12mm, Ø25×7.2mm, pin
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EM-Tec P6/45 multi pin stub holder 45° for 6 pin stubs, Ø35x14mm, M4
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Phenom PH22 bulk holder up to Ø22x12mm for Phenom metallurgical sample holder
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EM-Tec single sided conductive aluminium SEM tape 10mm x 33m
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EM-Tec 708.CT ESD safe PVDF/carbon fibre reinforced tweezers, sharp angled tips
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Micro-Tec GN3 glass fibre reinforced polyamide66 probe, sharp flat / large flat
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Value-Tec stainless steel crucible tongs, 258mm
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45/90 degree angled SEM pin stub Ø32mm diameter, standard pin, aluminium
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Chromium Target, various disk sizes, 99.95% Cr
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EMR Lacey Carbon support film on nickel, various square mesh
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EM-Tec FS22 combines two F12 FIB grid holders with two standard 12.7mm (1/1) pin stubs within a 27x27mm footprint. Both the F12 FIB grid holders and the pin stubs can be rotated independently in the holder for selecting the optimum orientation in the FIB/SEM system. The EM-Tec FS22 dual FIB grid and sample holder enables loading the samples and FIB grids close together. The FIB grid and the sample stubs are at the same level when using Si wafer samples.