EM-Tec FS22 combines two F12 FIB grid holders with two standard 12.7mm (1/1”) pin stubs within a 27x27mm footprint. Both the F12 FIB grid holders and the pin stubs can be rotated independently in the holder for selecting the optimum orientation in the FIB/SEM system. The EM-Tec FS22 dual FIB grid and sample holder enables loading the samples and FIB grids close together. The FIB grid and the sample stubs are at the same level when using Si wafer samples