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30 degree angled standard profile SEM pin stub Ø12.7 diameter standard pin, aluminium
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45 degree angled high profile SEM pin stub Ø12.7 diameter standard pin, aluminium
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45 degree angled SEM pin stub Ø25.4 diameter standard pin, aluminium
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45 degree angled standard profile SEM pin stub Ø12.7 diameter standard pin, aluminium
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45 degree angled Zeiss pin stub Ø12.7 diameter, short pin, aluminium
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45 degree angled Zeiss pin stub Ø25.4 diameter, short pin, aluminium
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45/90 degree angled high profile SEM pin stub Ø12.7 diameter standard pin, aluminium
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45/90 degree angled SEM pin stub Ø25.4 diameter standard pin, aluminium
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45/90 degree angled SEM pin stub Ø32mm diameter, standard pin, aluminium
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45/90 degree angled standard profile SEM pin stub Ø12.7 diameter standard pin, aluminium
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45/90 degree angled Zeiss pin stub Ø12.7 diameter, short pin, aluminium
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45/90 degree angled Zeiss pin stub Ø25.4 diameter, short pin, aluminium
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45/90 degree angled Zeiss pin stub Ø32mm diameter, short pin, aluminium
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70 degree EBSD angled standard profile SEM pin stub Ø12.7 diameter standard pin, aluminium
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Double 45/90 degree angled SEM pin stub Ø25.4 diameter standard pin, aluminium
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Double 45/90 degree angled Zeiss pin stub Ø25.4 diameter, short pin, aluminium
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Double 90 degree angled SEM pin stub Ø25.4 diameter standard pin, aluminium
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Double 90 degree angled SEM pin stub Ø32mm diameter, standard pin, aluminium
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Double 90 degree angled Zeiss pin stub Ø25.4 diameter, short pin, aluminium
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Double 90 degree angled Zeiss pin stub Ø32mm diameter, short pin, aluminium
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EM-Tec dual layer graphene TEM support film on 2000 fine aperture mesh copper grids
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EM-Tec dual layer graphene TEM support film on Lacey carbon on 300 mesh copper grids
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EM-Tec single layer graphene TEM support film on 2000 fine aperture mesh copper grids
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EM-Tec single layer graphene TEM support film on Lacey carbon on 300 mesh copper grids
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Hitachi Ø15x10mm M4 angled SEM sample stub, 45 degree, aluminium
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Hitachi Ø15x11mm M4 angled SEM sample stub, 45 and 90 degree, aluminium
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Hitachi Ø25x16mm M4 angled SEM sample stub, 45 degree, aluminium
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Hitachi Ø25x16mm M4 angled SEM sample stub, double 90 degree, aluminium
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Hitachi Ø32x12mm M4 angled SEM sample stub, 45 and 90 degree, aluminium
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Hitachi Ø32x12mm M4 angled SEM sample stub, double 90 degree, aluminium
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Hitachi Ø100×4.5mm M4 cylinder SEM sample stub, aluminium
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Hitachi Ø15x10mm M4 dish SEM sample stub, aluminium
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Hitachi Ø25×13.5mm/M6 stem pin type SEM sample stub, aluminium
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Hitachi Ø32x10mm M4 cylinder SEM sample stub, aluminium
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Hitachi Ø32x6mm M4 cylinder SEM sample stub, aluminium
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Hitachi Ø50x6mm M4 cylinder SEM sample stub, aluminium
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Hitachi Ø63x6mm M4 cylinder SEM sample stub, aluminium
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JEOL Ø25x16mm angled SEM sample stub with 45 and 90 degree, aluminium
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JEOL Ø25x16mm angled SEM sample stub with 45 degree, aluminium
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JEOL Ø25x16mm angled SEM sample stub with double 90 degree, aluminium
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JEOL Dish stub, Ø12.2×10 with 1.5mm dish depth, aluminium
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JEOL Ø32x12mm angled SEM sample stub with 45 and 90 degree, aluminium
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JEOL Ø32x12mm angled SEM sample stub with double 90 degree, aluminium
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Low profile SEM pin stub Ø12.7 diameter with 1mm height, aluminium
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Low profile SEM pin stub Ø12.7 diameter with 35° for Tescan FIBxSEM, aluminium
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Low profile SEM pin stub Ø12.7 diameter with 38° for FEI FIB, aluminium
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Low profile SEM pin stub Ø12.7 diameter with 90°, aluminium
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Low profile Zeiss pin stub Ø12.7 diameter with 1mm height, short pin, aluminium
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Low profile Zeiss pin stub Ø12.7 diameter with 36° for Zeiss SEM/ FIB systems, short pin, aluminium
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Low profile Zeiss pin stub Ø12.7 diameter with 90°, short pin, aluminium
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