Hitachi Ø25x16mm M4 angled SEM sample stub, 45 degree, aluminium – EMSIS ASIA – Electron Microscopy Imaging Company

Hitachi Ø25x16mm M4 angled SEM sample stub, 45 degree, aluminium

Please login to see price

SKU: 10-004226 Categories: Hitachi M4 & In Lens, SEM Sample Stubs

Description
Additional Information

Product Description

Hitachi Ø25x16mm M4 angled SEM sample stub, 45 degree, aluminium

Additional Information

Units Per Package	1, 5, 10