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EM-Tec F12 compact FIB grid holder for up to 2 FIB grids, pin
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EM-Tec F25 FIB grid holder for up to 5 FIB grids, M4
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EM-Tec F25 FIB grid holder for up to 5 FIB grids, pin
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EM-Tec FS21 FIB grid and sample holder for up to 2 FIB grids and Ø12.7mm pin stub, M4
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EM-Tec FS21 FIB grid and sample holder for up to 2 FIB grids and Ø12.7mm pin stub, pin
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EM-Tec FS22 FIB grid and sample holder for up to 2×2 FIB grids and 2x Ø12.7mm pin stub, M4
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EM-Tec FS22 FIB grid and sample holder for up to 2×2 FIB grids and 2x Ø12.7mm pin stub, pin
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EM-Tec FS25 FIB grid and sample holder for up to 5 FIB grids and Ø25.4mm pin stub, M4
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EM-Tec FS25 FIB grid and sample holder for up to 5 FIB grids and Ø25.4mm pin stub, pin
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EM-Tec P35 fixed 35°pre-tilt holder for Tescan FIB systems, Ø12.7x17mm, pin
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EM-Tec P36 fixed 36°pre-tilt holder for Zeiss FIB systems, Ø12.7x17mm, pin
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EM-Tec P36 fixed 36°pre-tilt holder for Zeiss FIB systems, Ø12.7x17mm, pin
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EM-Tec P38 fixed 36°pre-tilt holder for FEI FIB systems, Ø12.7x17mm, pin
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EM-Tec P38 fixed 36°pre-tilt holder for FEI FIB systems, Ø12.7x17mm, pin
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Low profile SEM pin stub Ø12.7 diameter with 35° for Tescan FIBxSEM, aluminium
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This product has multiple variants. The options may be chosen on the product page
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Low profile SEM pin stub Ø12.7 diameter with 38° for FEI FIB, aluminium
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This product has multiple variants. The options may be chosen on the product page
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Low profile Zeiss pin stub Ø12.7 diameter with 36° for Zeiss SEM/ FIB systems, short pin, aluminium
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This product has multiple variants. The options may be chosen on the product page
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